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TESP-V237N m, 320kHz, No Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for TappingMode and other non contact modes. Unmounted for use on standard AFM's. Bruker AFM Probes has introduced an improved version of its popular, TESP TESPA AFM probes. Brukers new line of TESP high quality premium etched silicon probes set the industry standard for TappingMode and non contact mode in

55 Cantilever Geometry: Rectangular Cantilevers Number: 1

They deliver extreme imaging speed without loss of resolution

55 Cantilever Geometry: Rectangular Cantilevers Number: 1 Front Side Coating: Conductive PtIr Back Side Coating: Reflective PtIr

Max Effective Length = 500 nm

025 Ωcm Silicon Cantilever Thickness (Nom): 3

This enables:

Bruker's new MESP-LM-V2 probe replaces the legacy MESP-LM probe

Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features

single crystal boron-doped diamond probes

FastScan-D probes have less than 3 degrees of bend

7 Cantilever Geometry: Triangular Cantilevers Number: 1 Front Side Coating: Conductive Pt/ Ir Back Side Coating: Reflective Pt/ Ir

300 nm image showing carbon nanotubes to be aligned with the crystalline structure of a quartz substrate

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